Ventura, CA, United States of America

Jordan Fine


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations of Jordan Fine in Multi-Tip Scanning Probe Microscopy

Introduction

Jordan Fine is an accomplished inventor based in Ventura, CA. He has made significant contributions to the field of microscopy, particularly through his innovative patent that enhances the calibration and imaging processes of multi-tip scanning probe microscopes. His work is pivotal in advancing the capabilities of atomic force microscopy (AFM).

Latest Patents

Jordan Fine holds a patent titled "Method for calibrating and imaging using multi-tip scanning probe microscope." This patent describes systems, methods, and program products designed for the calibration and scanning of multiple AFM probe heads used together for synchronous scanning. The automated calibration process utilizes scan data from multiple AFM probe heads to automatically calibrate the system. It positions the probe heads at relative offset positions that are successively closer and more precise. The technique allows for simultaneous and synchronous scanning of multiple heads to produce scan images, which are automatically evaluated to recognize common features. This process enables the calculation of relative offsets of the images, allowing for accurate positioning of each probe tip. The methods can be repeated at varying levels of precision and after probing or movement to new regions of interest.

Career Highlights

Jordan Fine is currently employed at FEI Company, where he continues to develop innovative solutions in microscopy. His work has been instrumental in enhancing the functionality and precision of AFM technologies.

Collaborations

Jordan collaborates with talented individuals such as Sean Dale Zumwalt and Anton Riley, contributing to a dynamic and innovative work environment.

Conclusion

Jordan Fine's contributions to the field of microscopy through his innovative patent demonstrate his expertise and commitment to advancing technology. His work not only enhances the capabilities of multi-tip scanning probe microscopes but also sets a foundation for future innovations in the field.

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