Seoul, South Korea

Joonhui Kim

This inventor holds 1 USPTO granted patent. Top assignee: Sogang University Research Foundation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joonhui Kim. Retrieved from https://idiyas.com/inventor/joonhui-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Joonhui Kim in Micro-Fluid Measurement

Introduction

Joonhui Kim is an accomplished inventor based in Seoul, South Korea. He has made significant contributions to the field of micro-fluid measurement technology. His innovative approach has led to the development of a unique measuring apparatus that enhances the efficiency and accuracy of fluid measurement.

Latest Patents

Joonhui Kim holds a patent for a micro-fluid measuring apparatus with an actuator and a tuning fork. This invention aims to provide a measuring apparatus that is reduced in size by substituting an optical measuring device. The apparatus includes a micro-tube that contains the micro-fluid, an actuator that vibrates the micro-tube, and a tuning fork that converts the vibration of the micro-tube into an electrical signal. He has 1 patent to his name.

Career Highlights

Joonhui Kim is associated with the Sogang University Research Foundation, where he continues to work on innovative projects. His research focuses on advancing measurement technologies that can be applied in various scientific fields.

Collaborations

Some of his notable coworkers include Jungchul Lee and Donghyuk Lee, who have collaborated with him on various projects related to micro-fluid measurement.

Conclusion

Joonhui Kim's contributions to micro-fluid measurement technology demonstrate his commitment to innovation and research. His work not only advances scientific understanding but also paves the way for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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