College Station, TX, United States of America

Joohyun Rhee

This inventor holds 1 USPTO granted patent. Top assignee: Texas A&M University System. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joohyun Rhee. Retrieved from https://idiyas.com/inventor/joohyun-rhee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Joohyun Rhee and a Patent for Passive Sensor Systems

Introduction

Joohyun Rhee is an inventor associated with College Station, Texas, and the Texas A&M University System. His patent work includes a system that uses sensors in computer input devices to monitor biometric and performance information.

Latest Patents

Rhee is credited with 1 patent: “Passive Sensor Systems for Peripheral Input Devices and the Use Thereof.” The invention describes a computer-connected mouse and keyboard, each equipped with a sensor that measures a user’s biometric parameters. The computer also tracks performance parameters associated with the devices and stores the collected information. Based on analysis of changes in these measurements, the system can alert the user or communicate electronically with a medical service provider or supervising entity.

Career Highlights

Rhee’s listed patent connects everyday computer peripherals with biometric monitoring and performance analysis. The approach is designed to support responses to changes detected in the user’s measurements.

Collaborations

Rhee’s listed coworker is Mark E. Benden. The patent information also associates Rhee with the Texas A&M University System.

Conclusion

Joohyun Rhee’s patent presents a way to combine biometric sensing and computer-use performance tracking through a mouse and keyboard, with potential alerts and communications based on the system’s analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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