Palisades Park, NJ, United States of America

Joo Hwang Chun

This inventor holds 1 USPTO granted patent. Top assignee: Yaron; Michael. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joo Hwang Chun. Retrieved from https://idiyas.com/inventor/joo-hwang-chun

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 83(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Joo Hwang Chun: Innovator in Vehicle Parking Technology

Introduction

Joo Hwang Chun is an accomplished inventor based in Palisades Park, NJ (US). He has made significant contributions to the field of vehicle parking technology. His innovative approach has led to the development of a unique patent that enhances parking efficiency.

Latest Patents

Joo Hwang Chun holds a patent for a "Combined transmitter and receiver for a vehicle parking indicator sensor." This invention aims to improve the accuracy and reliability of parking indicators, making it easier for drivers to find available parking spaces. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Throughout his career, Joo has worked with various professionals in the field. He is currently associated with Yaron Michael, a company that focuses on innovative solutions in technology. His work has been instrumental in advancing vehicle parking systems.

Collaborations

Joo has collaborated with notable individuals such as Michael Yaron and Dany Chalhoub. These partnerships have allowed him to leverage diverse expertise and enhance the impact of his inventions.

Conclusion

Joo Hwang Chun is a notable inventor whose work in vehicle parking technology has made a significant impact. His patent reflects his commitment to innovation and improving everyday experiences for drivers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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