San Jose, CA, United States of America

Jongki A L Suwandi

This inventor holds 1 USPTO granted patent. Top assignee: Sun Microsystems, Inc.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jongki A L Suwandi. Retrieved from https://idiyas.com/inventor/jongki-a-l-suwandi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 58(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Jongki A L Suwandi: Innovator in Software Testing Technologies

Introduction

Jongki A L Suwandi is a notable inventor based in San Jose, CA (US). He has made significant contributions to the field of software testing through his innovative patent. His work focuses on enhancing the reliability and efficiency of computer systems.

Latest Patents

Jongki A L Suwandi holds a patent titled "Method and apparatus for testing a computer system through software fault injection." This invention provides a system for testing a computer system by using software to inject faults while the system is operational. The method allows programmers to include fault points in the source code, which can trigger faults during execution. This approach enables thorough testing of the system's response to faults, ensuring better reliability.

Career Highlights

Jongki A L Suwandi is associated with Sun Microsystems, Inc., where he has contributed to various projects aimed at improving software testing methodologies. His expertise in fault injection techniques has positioned him as a valuable asset in the tech industry.

Collaborations

Jongki has worked alongside Madhusudhan Talluri, collaborating on projects that enhance software testing processes and methodologies.

Conclusion

Jongki A L Suwandi's innovative work in software testing through fault injection represents a significant advancement in ensuring the reliability of computer systems. His contributions continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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