Seoul, South Korea

Jonghyuk Kang

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonghyuk Kang. Retrieved from https://idiyas.com/inventor/jonghyuk-kang-qghtkasw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jonghyuk Kang

Introduction

Jonghyuk Kang is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a unique semiconductor inspection apparatus.

Latest Patents

Jonghyuk Kang holds 1 patent for his invention titled "Semiconductor inspection apparatus and semiconductor inspection method using the same." This patent discloses a semiconductor inspection apparatus that includes a stage supporting a semiconductor device, a first column that irradiates a first electron beam toward the semiconductor device, a second column that irradiates a second electron beam, and a detector that detects secondary electrons generated by the second electron beam. The first and second columns are positioned at different angles relative to the top surface of the semiconductor device, enhancing the inspection process.

Career Highlights

Jonghyuk Kang is currently employed at Samsung Electronics Co., Ltd., a leading company in the electronics industry. His work at Samsung has allowed him to collaborate with other talented professionals in the field, further advancing semiconductor technology.

Collaborations

Some of his notable coworkers include Yujin Cho and Inhye Park, who contribute to the innovative environment at Samsung Electronics.

Conclusion

Jonghyuk Kang's contributions to semiconductor inspection technology exemplify the spirit of innovation. His patent reflects a commitment to enhancing the efficiency and effectiveness of semiconductor inspections.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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