This inventor holds 4 USPTO granted patents and 2 published patent applications. Top assignee: Wisconsin Alumni Research Foundation. Active years: 2022-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022-2026
Title: Innovations of Jongho Lee
Introduction
Jongho Lee is a prominent inventor based in Madison, WI (US). He has made significant contributions to the field of imaging technology, holding a total of 4 patents. His work focuses on improving signal processing and depth estimation in various imaging applications.
Latest Patents
Jongho Lee's latest patents include innovative systems and methods aimed at enhancing the performance of imaging technologies. One of his notable patents is titled "Systems, methods, and media for improving signal-to-noise ratio in single-photon data." This invention provides a system that generates initial photon flux estimates and identifies similar scene patches to improve the accuracy of photon flux estimates. Another significant patent is "Systems, methods, and media for stochastic exposure coding that mitigates multi-camera interference in continuous wave time-of-flight imaging." This method involves stochastically selecting active slots for light emission and depth estimation, which enhances the quality of depth data captured in imaging systems.
Career Highlights
Jongho Lee is associated with the Wisconsin Alumni Research Foundation, where he applies his expertise in imaging technologies. His work has contributed to advancements in the field, particularly in enhancing the signal-to-noise ratio and depth estimation techniques.
Collaborations
Jongho collaborates with Mohit Gupta, a fellow researcher, to further explore and develop innovative solutions in imaging technology.
Conclusion
Jongho Lee's contributions to imaging technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in imaging systems and methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
