Company Filing History:
Years Active: 2015-2019
Title: Jongho Choe: Innovator in Optoelectronic Measurement and Metamaterials
Introduction
Jongho Choe is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of optoelectronics and metamaterials, holding a total of 2 patents. His innovative work focuses on non-contact measurement systems and advanced metamaterial structures.
Latest Patents
Jongho Choe's latest patents include a "System and method for non-contact measurement of optoelectronic properties of thin film." This invention features a system designed for non-contact measurement, which includes a sensing element that amplifies electromagnetic waves of a specific frequency. The system measures the optoelectronic properties of a thin film placed on the sensing element, with a server that extracts physical properties based on the measurements obtained.
Another notable patent is related to a "Metamaterial structure." This invention introduces a metamaterial that can resonate at two different wavelengths, allowing it to interact with light that excites quantum dots and light produced by the quantum dots themselves. The structure consists of a substrate, a quantum dot layer, and a resonance layer with two intersecting rectangular holes, enabling resonance at two distinct wavelengths.
Career Highlights
Jongho Choe has worked with esteemed organizations such as the Korea Institute of Science and Technology and the Electronics and Telecommunications Research Institute. His experience in these institutions has contributed to his expertise in the field of optoelectronics and materials science.
Collaborations
Some of his notable coworkers include Minah Seo and Sanghun Lee. Their collaborative efforts have likely played a role in advancing the research and development of innovative technologies in their respective fields.
Conclusion
Jongho Choe's contributions to optoelectronics and metamaterials highlight his role as a significant inventor in the industry. His patents reflect a commitment to advancing technology and improving measurement techniques in innovative ways.