Electronics and Telecommunications Research Institute

Korea Institute of Science and Technology

Jongho Choe

Sanghun Lee

Chulki Kim

Jinsoo Kim

Minah Seo

Q-Han Park

Choongi Choi

Disclosed herein is a system for non-contact measurement of an optoelectronic property. The system includes a sensing element configured to amplify an electromagnetic wave having a specific frequency, a thin film disposed on the sensing element such that an optoelectronic property of the thin film is measured, and an optoelectronic property measuring server configured to extract a physical property of the thin film based on the optoelectronic property of the thin film obtained when the electromagnetic wave amplified by the sensing element passes through the thin film.

System and method for non-contact measurement of optoelectronic properties of thin film

This invention relates to a metamaterial structure, which can simultaneously cause resonance at a wavelength of light that excites quantum dots and a wavelength of light produced by the quantum dots in a local space where quantum dots are located. The metamaterial structure, which can resonate with two wavelengths unlike conventional metamaterial structures that resonate with a single wavelength, includes a substrate, a quantum dot layer, and a resonance layer formed between the substrate and the quantum dot layer and having two rectangular holes which are formed to cross each other so that resonance occurs at two different resonance wavelengths.

Metamaterial structure

Growing community of inventors

Seoul, South Korea

Jongho Choe