Menlo Park, CA, United States of America

Jongduk Baek


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Location History:

  • Menlo Park, CA (US) (2010)
  • Palo Alto, CA (US) (2010)

Company Filing History:


Years Active: 2010

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2 patents (USPTO):Explore Patents

Title: Innovations by Jongduk Baek in Computed Tomography

Introduction

Jongduk Baek is a notable inventor based in Menlo Park, CA (US). He has made significant contributions to the field of computed tomography (CT) with his innovative methods. With a total of 2 patents, Baek's work focuses on enhancing imaging techniques in CT systems.

Latest Patents

Baek's latest patents include a method for data normalization in inverse geometry computed tomography systems. This method involves imaging an object using multiple sources mounted on a rotatable gantry. It addresses the challenge of unknown fluctuations in the intensity of the second source by utilizing projection data from both sources to correct for these fluctuations. Another significant patent is related to gain correction for CT systems. This method estimates ray gain for known objects to minimize errors in reconstructed values, thereby improving the accuracy of imaging unknown objects.

Career Highlights

Jongduk Baek is affiliated with Leland Stanford Junior University, where he continues to advance research in imaging technologies. His work has been instrumental in developing methods that enhance the reliability and precision of CT imaging.

Collaborations

Baek collaborates with Norbert Joseph Pelc, a fellow researcher in the field. Their partnership has contributed to the advancement of imaging techniques and methodologies.

Conclusion

Jongduk Baek's innovative contributions to computed tomography demonstrate his commitment to improving medical imaging technologies. His patents reflect a deep understanding of the complexities involved in CT systems and a dedication to enhancing their functionality.

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