The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Nov. 18, 2008
Norbert J. Pelc, Los Altos, CA (US);
Jongduk Baek, Menlo Park, CA (US);
Norbert J. Pelc, Los Altos, CA (US);
Jongduk Baek, Menlo Park, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A method for imaging an object in a computed tomography (CT) system with a plurality of sources comprising a first source and a second source, wherein the plurality of sources together with a detector array are mounted on a rotatable gantry, and wherein an intensity of the second source has unknown fluctuations is provided. Projection data is collected using the first source in a first gantry position. Projection data is collected using the second source in a second gantry position, wherein projection data from the first source in the first gantry position substantially overlaps projection data from the second source in the second gantry position. Data from the first source at the first gantry position is used to correct for source fluctuations of the second source at the second gantry position.