Cheonan-si, South Korea

Jongdoo Lee

This inventor holds 1 USPTO granted patent. Top assignee: Semes Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jongdoo Lee. Retrieved from https://idiyas.com/inventor/jongdoo-lee-nzqcb981

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jongdoo Lee and His Substrate Processing Invention.

Introduction

Jongdoo Lee is an inventor based in Cheonan-si, South Korea, and is associated with Semes Co., Ltd. His work includes a patent for equipment designed to process substrates while monitoring a component for deformation.

Latest Patents

Lee’s listed patent, “Substrate Processing Apparatus,” describes a body containing a substrate treatment space, a fluid supply unit, and an exhaust line. A clamp body surrounds and secures the apparatus body, while a friction prevention member sits between them to reduce friction. A conductor runs along at least part of the friction prevention member’s outer rim, and a processor detects possible deformation by analyzing an output signal generated in response to an electrical signal applied to the conductor. Lee is credited with 1 patent in the information provided.

Career Highlights

Lee’s patent reflects an engineering approach that combines substrate treatment equipment with a mechanism for detecting deformation in a friction prevention component. The listed company associated with his work is Semes Co., Ltd.

Collaborations

The coworkers identified in the provided information are Taejong Choi and Juyeon Song. Their specific roles or contributions to the patent are not stated.

Conclusion

Jongdoo Lee’s listed invention brings together substrate processing and deformation monitoring in an apparatus associated with Semes Co., Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…