Jong Won Kim

Title: Jong Won Kim: Innovator in Gene Detection Technologies

Introduction

Jong Won Kim is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of gene detection, holding a total of 4 patents. His innovative work focuses on methods that enhance the detection of specific genes, which are crucial for cancer diagnosis and prognosis.

Latest Patents

One of his latest patents is a "Method for detecting a c-Met gene using cleavable probe." This invention provides a detection kit that includes a primer set specifically bound to the c-Met gene and a cleavable probe that binds to the amplification product of the c-Met gene. This method is designed to efficiently detect low concentrations of c-Met gene expression, which is vital for cancer diagnosis and prognosis.

Another notable patent is the "Method for multiplex-detecting chronic myelogenous leukemia gene using cleavable probe." This invention also features a detection kit that includes a primer set specifically bound to the chronic myelogenous leukemia (CML) gene and a cleavable probe for the amplification product. This method allows for the efficient detection of low CML gene expression, aiding in the diagnosis and prognosis of CML.

Career Highlights

Jong Won Kim has worked with reputable organizations, including the Samsung Life Public Welfare Foundation and Doosan Infracore Co., Ltd. His experience in these companies has contributed to his expertise in gene detection technologies.

Collaborations

Throughout his career, Jong Won Kim has collaborated with notable colleagues, including Kwang Woo Kim and Do Hyun Nam. These collaborations have further enriched his research and development efforts in the field.

Conclusion

Jong Won Kim is a distinguished inventor whose work in gene detection technologies has the potential to significantly impact cancer diagnosis and prognosis. His innovative patents reflect his commitment to advancing medical science and improving patient outcomes.