Gunpo, South Korea

Jong Sun Won

This inventor holds 1 USPTO granted patent. Top assignee: C'est Image, Inc.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jong Sun Won. Retrieved from https://idiyas.com/inventor/jong-sun-won

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 10.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Jong Sun Won: Innovator in Image Sensing Technology

Introduction

Jong Sun Won is a notable inventor based in Gunpo, South Korea. He has made significant contributions to the field of image sensing technology. His innovative work focuses on enhancing the capabilities of image sensors, particularly in varying lighting conditions.

Latest Patents

Jong Sun Won holds a patent for an "Image sensing device including image sensor with high dynamic range." This invention features a semiconductor substrate and multiple light-receiving elements. Additionally, it incorporates light-shield films on some light-receiving elements to partially block incoming light. This design allows the image sensing device to capture accurate images in both bright and dark environments.

Career Highlights

Jong Sun Won is associated with C'est Image, Inc., where he continues to develop advanced imaging technologies. His work has positioned him as a key player in the field of image sensing.

Collaborations

Some of his notable coworkers include Heung Sik Kim and Yong Ahn Ha. Their collaborative efforts contribute to the innovative environment at C'est Image, Inc.

Conclusion

Jong Sun Won's contributions to image sensing technology demonstrate his commitment to innovation and excellence. His patent for a high dynamic range image sensor showcases his ability to address challenges in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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