Changwon, South Korea

Jong-seo Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Techwin Co., Ltd.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jong-seo Lee. Retrieved from https://idiyas.com/inventor/jong-seo-lee-rff3s6ig

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Jong-seo Lee: Innovator in Monitoring Camera Technology

Introduction

Jong-seo Lee is a notable inventor based in Changwon, South Korea. He has made significant contributions to the field of monitoring camera technology. His innovative approach has led to the development of a unique method for controlling monitoring cameras.

Latest Patents

Jong-seo Lee holds a patent for a "Method of controlling monitoring camera and apparatus for controlling monitoring camera by using the method." This invention provides a method for controlling a monitoring camera that performs panning, tilting, and zooming. The method includes generating a panoramic image file by controlling the monitoring camera to perform panning and tilting. Additionally, it allows for a setting operation in a user setting mode while displaying a panoramic image of the generated file.

Career Highlights

Jong-seo Lee is currently employed at Samsung Techwin Co., Ltd., a leading company in the security and monitoring technology sector. His work has been instrumental in advancing the capabilities of monitoring systems.

Collaborations

He has collaborated with talented coworkers, including Joon-young Park and Myung-seok An, to further enhance the development of innovative technologies in their field.

Conclusion

Jong-seo Lee's contributions to monitoring camera technology exemplify the spirit of innovation. His patent reflects a commitment to improving user experience and functionality in surveillance systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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