Suwon-si, South Korea

Jong Hwan Shin

This inventor holds 1 USPTO granted patent. Top assignee: Sungkyunkwan University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jong Hwan Shin. Retrieved from https://idiyas.com/inventor/jong-hwan-shin-aktcdc22

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Jong Hwan Shin in Liver Examination Technology.

Introduction

Jong Hwan Shin is an accomplished inventor based in Suwon-si, South Korea. He has made significant contributions to the field of medical technology, particularly in ultrasound liver examinations. His innovative approach aims to enhance the accuracy and efficiency of liver assessments.

Latest Patents

Jong Hwan Shin holds a patent for a device and method for determining the extent of liver examination. This invention relates to a technology that recognizes and determines the extent of a liver being examined by an operator during an ultrasound liver examination. The method involves receiving an ultrasound image of a liver region, extracting features from the image, determining the liver's cross-section based on these features, and assessing the extent of the examination from the ultrasound image.

Career Highlights

Jong Hwan Shin is affiliated with Sungkyunkwan University, where he contributes to research and development in medical technologies. His work focuses on improving diagnostic methods and enhancing patient care through innovative solutions.

Collaborations

Jong Hwan Shin collaborates with Tae Wook Kang, a fellow researcher, to advance their shared goals in medical technology innovation.

Conclusion

Jong Hwan Shin's contributions to liver examination technology exemplify the impact of innovation in the medical field. His patent reflects a commitment to improving diagnostic accuracy and patient outcomes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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