Daejeon, South Korea

Jong Ahn Kim

This inventor holds 2 USPTO granted patents. Top assignees: Korea Research Institute of Standards and Science, Micro Motion Technology Co., Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jong Ahn Kim. Retrieved from https://idiyas.com/inventor/jong-ahn-kim-7viekb4n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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2 patents (USPTO):Explore Patents

Title: Jong Ahn Kim: Innovator in Silicon Wafer Measurement Technologies

Introduction

Jong Ahn Kim is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of measurement technologies, particularly in the area of silicon wafers. With a total of 2 patents, his work focuses on enhancing precision in measurement techniques.

Latest Patents

One of his latest patents is a device and method for measuring the via hole of a silicon wafer. This invention allows for precise measurement of the depth of the via hole without causing any damage to the wafer. The method utilizes broadband infrared light, which is radiated onto the silicon wafer, taking advantage of its superior light transmission properties. The depth is measured based on the light reflected from the wafer's boundary surfaces and the interference signal of reference light.

Another significant patent is the spatial phase shifting interferometer using multi-wavelength technology. This invention enables rapid and precise measurement of the shape of a measurement object by simultaneously oscillating lasers of different wavelengths. The oscillated lasers pass through a beam splitter and a lens, allowing for the analysis of the interference fringe of the measurement object.

Career Highlights

Jong Ahn Kim has worked with esteemed organizations such as the Korea Research Institute of Standards and Science and Micro Motion Technology Co., Ltd. His experience in these institutions has contributed to his expertise in measurement technologies.

Collaborations

Throughout his career, he has collaborated with notable colleagues, including Jae Wan Kim and Jong Han Jin. These collaborations have further enriched his work and innovations in the field.

Conclusion

Jong Ahn Kim is a distinguished inventor whose work in silicon wafer measurement technologies has paved the way for advancements in precision measurement. His innovative patents reflect his commitment to enhancing measurement techniques in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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