New Ipswich, NH, United States of America

Jonathan W Larson



Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 48(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations by Jonathan W Larson

Introduction

Jonathan W Larson is an accomplished inventor based in New Ipswich, NH (US). He has made significant contributions to the field of measurement optimization through his innovative patent. His work focuses on enhancing the detection and analysis of agents in samples using advanced optical components.

Latest Patents

Jonathan holds a patent for "Systems and methods for measurement optimization." This invention relates to methods and systems for detecting and analyzing an agent in a sample with a chip that incorporates optical components. His innovative approach aims to improve the efficiency and accuracy of measurements in various applications.

Career Highlights

Jonathan is currently associated with US Genomics, Inc., where he applies his expertise in developing cutting-edge technologies. His work at the company reflects his commitment to advancing the field of genomics and measurement systems.

Collaborations

Throughout his career, Jonathan has collaborated with notable professionals, including Gregory R Yantz and George H Seward. These collaborations have contributed to the development of innovative solutions in his field.

Conclusion

Jonathan W Larson's contributions to measurement optimization demonstrate his dedication to innovation and technology. His patent and work at US Genomics, Inc. highlight his role as a significant figure in the field.

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