San Diego, CA, United States of America

Jonathan Tappan

This inventor holds 1 USPTO granted patent. Top assignee: Qualcomm Incorporated. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonathan Tappan. Retrieved from https://idiyas.com/inventor/jonathan-tappan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jonathan Tappan

Introduction

Jonathan Tappan is an accomplished inventor based in San Diego, CA. He is known for his significant contributions to the field of electronic devices, particularly in the testing and diagnosis of integrated circuits (IC) through innovative methodologies.

Latest Patents

Jonathan holds a patent titled "Reliability of vias and diagnosis by e-beam probing." This patent focuses on testing electronic devices by identifying failure nets that cause device failures. The process involves locally stressing the failure net while ensuring that other components remain unaffected. By observing changes in the signal produced by the stressed net, the source of the failure can be accurately identified. This innovative approach enhances the reliability of electronic devices.

Career Highlights

Jonathan Tappan is currently employed at Qualcomm Incorporated, a leading company in the telecommunications industry. His work at Qualcomm has allowed him to apply his expertise in electronic device testing and contribute to advancements in technology.

Collaborations

Some of Jonathan's notable coworkers include William Xia and Martin L Villafana. Their collaboration fosters a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Jonathan Tappan's contributions to the field of electronic devices through his patent and work at Qualcomm highlight his role as a significant inventor. His innovative methods for diagnosing device failures are paving the way for advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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