Danville, CA, United States of America

Jonathan Richard Wray

This inventor holds 2 USPTO granted patents and 3 published patent applications and 1 EPO patent. Top assignee: Aible Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonathan Richard Wray. Retrieved from https://idiyas.com/inventor/jonathan-richard-wray

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.4

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Jonathan Richard Wray: Inventor in Model Training and Performance Analysis

Introduction

Jonathan Richard Wray is an inventor based in Danville, California. His work includes methods for training and evaluating models under varying resource constraints. He is associated with 2 patents.

Latest Patents

Wray’s listed patents address model training, deployment, and performance assessment.

“Training and Deploying Models Using Global Resource Levels” describes a method for using outputs from models associated with one organization to inform the training of models associated with another. The method incorporates datasets, resource levels, and global constraints, assesses model performance, and may retrain the first set of models.

“Analyzing Performance of Models Trained with Varying Constraints” describes receiving information about models trained with different resource levels, assessing their performance, and determining and displaying a feasible performance region. The region connects constraints with the models that meet them.

Career Highlights

Wray has worked with Aible Inc. and Robert Bosch. His listed patent work focuses on techniques for managing model resources and evaluating performance under constraints.

Collaborations

His listed coworkers include Arijit Sengupta and James Zalman.

Conclusion

Jonathan Richard Wray’s patent work centers on coordinating model training across resource constraints and analyzing the performance of models trained under varying conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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