Winchester, MA, United States of America

Jonathan M Mooney


Average Co-Inventor Count = 2.8

ph-index = 3

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 1998-1999

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4 patents (USPTO):Explore Patents

Title: Innovations by Jonathan M Mooney: Advancements in Thermal Detection and Imaging

Introduction:

Jonathan M Mooney is a notable inventor based in Winchester, MA, recognized for his contributions to the field of thermal detection and imaging. With a prolific portfolio of four patents, his work has significantly advanced the technologies used in infrared radiation detection and material analysis.

Latest Patents:

Mooney's latest patents include the innovative "Thermionic Thermal Detector and Detector Array." This groundbreaking thermal imager operates in the infrared portion of the electromagnetic spectrum, producing a video image where brightness reflects the incident power. The design features a novel thermionic thermal detector made from a silicon on insulator (SOI) wafer, incorporating a thermal insulating gap. A reverse-biased CoSi₂ diode is strategically suspended over this gap to detect temperature variations through thermionic emissions, generating an output signal directly correlated to temperature changes.

Another significant patent focuses on "Locating Defects in Solid Material." This invention presents a method and apparatus for rapid, accurate, and nondestructive imaging of defects in solid materials, particularly in semiconductor wafers. By illuminating the wafer with an infrared (IR) source and capturing transmitted IR radiation with a camera, this technique utilizes filtering to identify and image various defects.

Career Highlights:

Jonathan Mooney has made substantial contributions to the field while working with the United States of America as represented by the Secretary of the Air. His innovative solutions in thermal detection have positioned him as a leading figure in technology development within defense and aerospace applications.

Collaborations:

Throughout his career, Mooney has collaborated with esteemed colleagues, including Darin J Leahy and Maxwell M Chi. Together, they have engaged in research and development efforts that have led to significant advancements in imaging technology and defect detection methodologies.

Conclusion:

Jonathan M Mooney's work exemplifies the spirit of innovation that drives advancements in thermal detection and imaging. His patented technologies not only enhance the understanding of infrared detection but also pave the way for future developments in the field. As a dedicated inventor, Mooney continues to contribute valuable insights and solutions to the scientific and engineering communities.

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