Jonathan Isaac Gittleman

Title: The Innovations of Jonathan Isaac Gittleman

Introduction

Jonathan Isaac Gittleman is a notable inventor based in Trenton, NJ (US). He holds a total of 5 patents that showcase his contributions to the field of technology and materials science. His work primarily focuses on non-destructive testing methods and optical recording technologies.

Latest Patents

One of Gittleman's latest patents is titled "Non-destructive testing of SOS wafers using surface photovoltage." This innovative device employs the electrically equivalent of an inserted capacitance in series within a measuring circuit. It utilizes a pair of thin iridescent coated glasses positioned on either side of a silicon-on-sapphire (SOS) wafer. The device is designed to detect the altered signal resulting from surface photovoltage charge due to absorbed incident light, allowing for efficient non-destructive testing of SOS wafers. Another significant patent is for a "multi-layer optical record blank and information record." This invention comprises various layers designed to achieve low-reflection conditions, enabling information to be recorded as variations of an optical property in the heat-sensitive information layer.

Career Highlights

Throughout his career, Gittleman has worked with prominent organizations, including RCA Inc. and the U.S. Government as represented by the Secretary of the Army. His experience in these institutions has contributed to his expertise in developing innovative technologies.

Collaborations

Gittleman has collaborated with notable individuals in his field, including Harry Louis Pinch and Benjamin Abeles. These partnerships have likely enriched his work and led to further advancements in his inventions.

Conclusion

Jonathan Isaac Gittleman is a distinguished inventor whose work in non-destructive testing and optical recording has made significant contributions to technology. His innovative patents reflect his dedication to advancing the field and improving existing methodologies.