Jonathan David Byer

Title: Innovations of Jonathan David Byer

Introduction

Jonathan David Byer is an accomplished inventor based in St. Joseph, MI (US). He has made significant contributions to the field of mass spectrometry through his innovative patent. His work focuses on enhancing the accuracy and efficiency of mass defect plots, which are crucial for chemical analysis.

Latest Patents

Jonathan David Byer holds a patent for a "User defined scaled mass defect plot with filtering and labeling." This method involves determining mass defect plots with user-defined mass scaling, filtering, and labeling in a mass spectrometer. The implementation of this method includes several steps: generating a mass defect plot from the data, filtering ions without associated isotopologue ions, selecting an unidentified ion, determining its isotope pattern, identifying elements indicated by the pattern, searching for formulas containing those elements, determining the chemical formula of the identified ion, and displaying the chemical formulas on a screen. This patent showcases his expertise and innovative approach in the field.

Career Highlights

Jonathan is currently employed at Leco Corporation, where he continues to develop and refine technologies related to mass spectrometry. His work at Leco Corporation has allowed him to collaborate with other talented professionals in the field, further enhancing his contributions to scientific research.

Collaborations

One of his notable coworkers is Kevin Matthew Siek, with whom he has likely shared insights and expertise in their respective projects. Their collaboration exemplifies the importance of teamwork in driving innovation and achieving breakthroughs in technology.

Conclusion

Jonathan David Byer is a notable inventor whose work in mass spectrometry has led to significant advancements in the field. His patent reflects his dedication to improving analytical methods, and his career at Leco Corporation positions him as a key player in ongoing innovations.