Leco Corporation

Jonathan David Byer

Kevin Matthew Siek

A method of determining mass defect plots with user-defined mass scaling, filtering, and labeling in a mass spectrometer is described. An implementation of the method comprises, (i) generating a mass defect plot from the data, (ii) filtering all ions in the mass defect plot that do not have an associated isotopologue ion, (iii) selecting an unidentified ion, (iv) determining an isotope pattern of the unidentified ion, (v) identifying one or more elements indicated by the isotope pattern for the unidentified ion; (vi) searching formulas containing one or more elements indicated by the isotope pattern for the unidentified ion, (vii) determining a chemical formula of the identified ion, and (viii) displaying the chemical formulas for the unidentified ion on a screen.

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St. Joseph, MI, United States of America

Jonathan David Byer