Stevensville, MD, United States of America

Jonathan D Ellis

This inventor holds 1 USPTO granted patent. Top assignee: The University of North Carolina at Charlotte. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonathan D Ellis. Retrieved from https://idiyas.com/inventor/jonathan-d-ellis-4yf8obnh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Innovations of Jonathan D Ellis

Introduction

Jonathan D Ellis is an accomplished inventor based in Stevensville, MD (US). He has made significant contributions to the field of surface property measurement through his innovative patent. His work focuses on enhancing the accuracy and reliability of material property measurements.

Latest Patents

Jonathan D Ellis holds a patent for an "Apparatus and method for surface property measurement with in-process compensation for instrument frame distortion." This invention provides a method for performing surface property measurements, such as workpiece hardness, while compensating for instrument frame distortion. The apparatus includes a rigid base, a stylus for interacting with the specimen's surface, a proximity detector sensor, and an actuator to maintain the necessary distance between the sensor and the specimen.

Career Highlights

Jonathan is affiliated with the University of North Carolina at Charlotte, where he contributes to research and development in his field. His expertise in surface property measurement has positioned him as a valuable asset in academic and industrial applications.

Collaborations

Jonathan has collaborated with Stuart T Smith, enhancing the scope and impact of their research endeavors. Their partnership has led to advancements in measurement techniques and methodologies.

Conclusion

Jonathan D Ellis is a notable inventor whose work in surface property measurement has paved the way for improved accuracy in material testing. His contributions continue to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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