Waukesha, WI, United States of America

Jonathan Boutot

This inventor holds 3 USPTO granted patents. Top assignees: General Electric Company, Ge Precision Healthcare LLC. Active years: 2019-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonathan Boutot. Retrieved from https://idiyas.com/inventor/jonathan-boutot

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 7.0

ph-index = 2

Forward Citations = 43(Granted Patents)


Company Filing History:


Years Active: 2019-2026

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3 patents (USPTO):Explore Patents

Title: The Innovations of Jonathan Boutot

Introduction

Jonathan Boutot is an accomplished inventor based in Waukesha, WI (US). He has made significant contributions to the field of imaging technology, holding a total of 3 patents. His work is recognized for its impact on the industry, particularly through his association with General Electric Company.

Latest Patents

Among his latest innovations is an advanced imaging apparatus. This invention showcases his expertise and commitment to enhancing imaging technology, reflecting the innovative spirit of General Electric Company.

Career Highlights

Throughout his career, Jonathan has demonstrated a strong dedication to research and development. His role at General Electric Company has allowed him to collaborate with other talented professionals in the field, furthering the company's mission to innovate.

Collaborations

Jonathan has worked alongside notable colleagues such as Ross Christopher Stalter and Michael Smith. Their combined efforts contribute to the success of their projects and the advancement of technology at General Electric Company.

Conclusion

In summary, Jonathan Boutot is a notable inventor whose work in imaging technology has led to significant advancements. His contributions, along with his collaborations, continue to shape the future of innovation in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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