East Grinstead, United Kingdom

Jonathan (Boff) Anthony Anderson

This inventor holds 1 USPTO granted patent. Top assignee: Westerngeco L.l.p.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonathan (Boff) Anthony Anderson. Retrieved from https://idiyas.com/inventor/jonathan-boff-anthony-anderson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Jonathan (Boff) Anthony Anderson and Time-Lapse Seismic Imaging.

Introduction

Jonathan (Boff) Anthony Anderson is an inventor associated with East Grinstead, Great Britain. His patent work concerns methods for comparing seismic survey data to generate time-lapse difference images.

Latest Patents

Anderson is credited with 1 patent: “Time-lapse seismic acquisition - Methods for generating a time lapse difference image.” The method estimates traces from each of two seismic survey data sets at the trace coordinates of the other, then calculates trace differences across the coordinates represented in both data sets. This approach supports the generation of difference images for comparing seismic surveys acquired at different times.

Career Highlights

Anderson’s listed invention addresses a technical challenge in time-lapse seismic analysis: comparing survey data sets whose trace coordinates may not align. The patent describes estimating traces across the coordinate sets before calculating their differences.

Collaborations

Anderson is associated with WesternGeco L.L.P. His listed coworkers include Stephen Pickering and Ralf Ferber.

Conclusion

Jonathan (Boff) Anthony Anderson’s patent focuses on a method for aligning and comparing seismic traces, contributing to techniques for producing time-lapse seismic difference images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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