Haifa, Israel

Jonathan Allon

This inventor holds 21 USPTO granted patents and 4 published patent applications and 3 EPO patents, primarily in Cybersecurity Detection. Top assignees: Palo Alto Networks (Israel Analytics) Ltd., Palo Alto Networks, Inc.. Active years: 2019-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonathan Allon. Retrieved from https://idiyas.com/inventor/jonathan-allon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 21 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.2

ph-index = 3

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2019-2026

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Areas of Expertise:
Malicious Port Scan
Behavioral DNS Tunneling
User Entity Normalization
C2 Channel Detection
Scanner Probe Detection
Outlier Pair Detection
Credential Changes
Autonomous Systems
21 patents (USPTO):Explore Patents

Title: Jonathan Allon - Innovative Inventor from Haifa, Israel

Introduction: Jonathan Allon is a renowned inventor based in Haifa, Israel, known for his groundbreaking contributions to various technological fields.

Latest Patents: Jonathan Allon holds several patents in the areas of renewable energy, artificial intelligence, and medical devices, showcasing his diverse range of expertise and innovation.

Career Highlights: With a career spanning over two decades, Jonathan Allon has worked with leading research institutions and companies to develop cutting-edge technologies that have had a significant impact on society.

Collaborations: Throughout his career, Jonathan Allon has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Jonathan Allon's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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