Newark, DE, United States of America

Jon W Matthews

This inventor holds 2 USPTO granted patents. Top assignee: E.i. Dupont De Nemours and Company. Active years: 1991-1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jon W Matthews. Retrieved from https://idiyas.com/inventor/jon-w-matthews

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1991-1992

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2 patents (USPTO):Explore Patents

Title: Jon W Matthews: Innovator in Overlay Proof Technology

Introduction

Jon W Matthews is a notable inventor based in Newark, DE (US). He has made significant contributions to the field of overlay proof technology, holding 2 patents that showcase his innovative approach to multilayer, multicolor overlay proofs.

Latest Patents

Matthews' latest patents include "Overlay proofs comprising precolored and toned images" and "Method of making overlay proofs comprising precolored and toned images." Both patents describe a multilayer, multicolor overlay proof that comprises at least one precolored overlay image and at least one toned overlay image. Additionally, these patents detail the process for preparing such overlay proofs, highlighting Matthews' expertise in this specialized area.

Career Highlights

Jon W Matthews is currently employed at E.I. du Pont de Nemours and Company, where he continues to develop and refine his innovative ideas. His work at this esteemed company has allowed him to push the boundaries of overlay proof technology and contribute to advancements in the field.

Collaborations

Throughout his career, Matthews has collaborated with talented individuals such as Jeffrey W Milner and Harvey Walter Taylor, Jr. These collaborations have further enriched his work and fostered a creative environment for innovation.

Conclusion

Jon W Matthews stands out as a significant figure in the realm of overlay proof technology, with his patents reflecting his dedication to innovation. His contributions continue to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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