McLean, VA, United States of America

Jon Stofer


Average Co-Inventor Count = 4.3

ph-index = 1


Company Filing History:


Years Active: 2024-2025

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3 patents (USPTO):Explore Patents

Title: Jon Stofer: Innovator in Data Management Technologies

Introduction

Jon Stofer is a prominent inventor based in McLean, VA (US), known for his contributions to data management technologies. With a total of 3 patents, he has made significant strides in the field of anomaly detection and machine learning applications in data management.

Latest Patents

Jon's latest patents include innovative systems and methods for data lineage-based system anomaly detection. These systems utilize processors to receive initial lineage records that document changes in data items across a lineage stream. By generating a historical distribution as a baseline for data processors, his methods enable real-time anomaly detection by comparing current behaviors against established baselines.

Another notable patent focuses on using machine learning to manage data effectively. This invention allows computing systems to leverage lineage data to identify relationships between datasets. It can determine access rights based on similarity scores between original and derivative datasets, ensuring that users have appropriate access levels.

Career Highlights

Jon Stofer is currently employed at Capital One Services, LLC, where he applies his expertise in data management and machine learning. His work has been instrumental in enhancing the company's data processing capabilities and ensuring data integrity.

Collaborations

Throughout his career, Jon has collaborated with notable colleagues, including Thomas J O'Connor and Jose Moreno. These partnerships have fostered innovation and contributed to the development of advanced data management solutions.

Conclusion

Jon Stofer's innovative work in data management technologies has positioned him as a key figure in the field. His patents reflect a commitment to improving data integrity and access management through advanced methodologies.

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