This inventor holds 3 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 1989-1993.
Location History:
- Yorktown Heights, NY (US) (1989 - 1991)
- Redmond, WA (US) (1993)
Company Filing History:
Years Active: 1989-1993
Title: Innovations by Jon R Mandeville
Introduction
Jon R Mandeville is a notable inventor based in Yorktown Heights, NY (US). He has made significant contributions to the field of imaging systems, holding a total of 3 patents. His work primarily focuses on advanced imaging technologies that enhance the inspection and analysis of various objects.
Latest Patents
One of Mandeville's latest patents is a tandem linear scanning confocal imaging system. This innovative system utilizes an opaque mask with a slit and a row of pinpoint sensors to obtain sufficient data for imaging and inspecting objects, such as electronics, in a single one-dimensional scan. The system is capable of producing multiple images at different heights and in different spectral bands simultaneously. Notably, it requires no moving parts, with the only movement being the motorized conveying of the object along the scanning path. This design allows for color imaging and simultaneous brightfield and darkfield imaging of the object.
Another significant patent is a system for detecting and analyzing rounded objects. This system determines the characteristics of features like via holes in printed circuit boards. It employs an image scanner to provide a raster scan image of pixels representing the rounded feature. The system includes tangent detecting circuits that select groups of pixels clustered around chosen azimuths, enabling the analysis of the rounded feature's limits, such as diameter and radius.
Career Highlights
Jon R Mandeville is associated with the International Business Machines Corporation (IBM), where he has contributed to various innovative projects. His expertise in imaging systems has positioned him as a key player in the development of advanced technologies that improve object inspection and analysis.
Collaborations
Mandeville has collaborated with notable coworkers, including Pieter J Kerstens and Frederick Yung-Fung Wu. Their combined efforts have led to advancements in imaging technologies and enhanced the capabilities of the systems they have developed.
Conclusion
Jon R Mandeville's contributions to imaging technology through his patents and work at IBM highlight his innovative spirit and dedication to advancing the field. His inventions continue to impact the way objects are imaged and inspected, showcasing the importance of innovation in technology.
