This inventor holds 1 USPTO granted patent. Top assignee: Kansas State University Research Foundation. Active years: 1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1994
Title: Jon M Faubion: Innovator in Wheat Cultivar Identification
Introduction
Jon M Faubion is a notable inventor based in Manhattan, Kansas. He has made significant contributions to the field of agricultural technology, particularly in the identification of wheat cultivars. His innovative approach utilizes advanced imaging techniques to enhance the accuracy of wheat classification.
Latest Patents
Faubion holds a patent for a method titled "Identification of wheat cultivars by visual imaging." This patent describes a process that employs an imaging device, such as a video camera, in conjunction with a computer to acquire and process images of grain samples. The method involves capturing images of the kernel and germ of each grain, converting these images into a digital format, and storing data that corresponds to the edges of the kernel and germ. By analyzing the image characteristics and comparing them to known standards, the specific cultivar of wheat can be identified. This innovative method has the potential to streamline the classification process in agricultural practices.
Career Highlights
Faubion is affiliated with the Kansas State University Research Foundation, where he continues to advance research in agricultural technology. His work has garnered attention for its practical applications in improving wheat production and quality.
Collaborations
Some of his notable coworkers include Andra J Cullen and Russell C Hoseney, who have collaborated with him on various research projects related to wheat and agricultural innovations.
Conclusion
Jon M Faubion's contributions to the identification of wheat cultivars through visual imaging represent a significant advancement in agricultural technology. His innovative methods are poised to enhance the efficiency and accuracy of wheat classification, benefiting the agricultural community.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
