Middleton, WI, United States of America

Jon J McCarthy


Average Co-Inventor Count = 2.2

ph-index = 6

Forward Citations = 156(Granted Patents)


Company Filing History:


Years Active: 1981-2002

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7 patents (USPTO):Explore Patents

Title: Innovations by Jon J McCarthy

Introduction

Jon J McCarthy is a notable inventor based in Middleton, WI (US). He holds a total of 7 patents that showcase his contributions to the field of x-ray optics and energy dispersive spectroscopy. His work has significantly advanced the capabilities of detection performance in various applications.

Latest Patents

One of his latest patents involves the application of x-ray optics to energy dispersive spectroscopy. In this invention, an x-ray optic is utilized in conjunction with an energy dispersive spectroscopy (EDS) detector to enhance detection performance. This combined optic and detector can be employed in scanning electron microscope or environmental scanning electron microscope (ESEM) applications. The grazing incidence optic (GIO) serves as a flux enhancing collimator for the EDS detector, enabling effective electron beam microanalysis. The GIO, when paired with the EDS, provides substantial intensity gain for x-ray lines with energy below 1 keV. Additionally, the GIO introduces a modest focus effect by limiting the field of view of the detector while maintaining minimal spectral effects. This innovation is particularly useful in applications that utilize broad beam excitation, such as ESEM or systems employing x-ray fluorescence.

Another significant patent by McCarthy is a wavelength dispersive x-ray spectrometer with an x-ray collimator optic. This invention features a grazing incidence mirror optic that houses a polycapillary x-ray optic. The design ensures that the polycapillary optic does not interfere with the operation of the grazing incidence mirror. This configuration extends the range of the grazing incidence mirror optic to higher energy ranges. The x-ray collimator can be integrated into a wavelength dispersive x-ray spectrometer, which includes a diffracting element and an x-ray detector. This spectrometer can be utilized alongside energy beam microscopes, such as electron microscopes, to analyze x-rays emitted from sample specimens.

Career Highlights

Throughout his career, Jon J McCarthy has worked with several companies, including Tracor Northern, Inc. and Noran Instruments, Inc. His experience in these organizations has contributed to his expertise in the field of x-ray optics and spectroscopy.

Collaborations

Some of his notable coworkers include James F Aeschbach and Thomas F Kelly. Their collaborations have likely played a role in advancing the innovations that McCarthy has developed.

Conclusion

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