The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1989
Filed:
Dec. 14, 1987
Applicant:
Inventors:
Jon J McCarthy, Middleton, WI (US);
John D Fairing, Baldwin, MO (US);
Jeffrey C Buchholz, Cross Plains, WI (US);
Assignee:
Tracor Northern, Inc., Middleton, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
350507 ; 350527 ; 350274 ;
Abstract
A Tandem Scanning Microscope is disclosed using a modified Nipkow disk design. With this scanning system, scanning is performed using many apertures at once and using one disk for both image and illumination scanning. The apertures in the disk are in an annular pattern of spiral arms. Each aperture is located along a spiral arm at the end of a radius vector. Relative aperture locations are established in accordance with a mathematical relationship.