This inventor holds 2 USPTO granted patents. Top assignee: Battelle Memorial Institute. Active years: 1996-2002.
Company Filing History:
Years Active: 1996-2002
Title: Jon H Wahl: Innovator in Spectral Analysis and Ion Detection
Introduction
Jon H Wahl is a notable inventor based in Richland, WA (US). He has made significant contributions to the fields of spectral analysis and ion detection, holding a total of 2 patents. His work has implications in various scientific and industrial applications.
Latest Patents
Wahl's latest patents include a method and apparatus for spectral and chromatographic data analysis. This invention utilizes a spectral analysis technique to characterize the presence and quantification of peaks in an indexed data set for samples that match a reference species. The method also determines whether a sample matches or does not match the reference species, expanding the model for quantification of peak characteristics. Another significant patent is for an ion current detector designed for high-pressure ion sources. This invention monitors signals arising from ions produced by electrospray or other high-pressure ion sources, providing diagnostic capabilities regarding the quality of separation and the operation of an electrospray source.
Career Highlights
Jon H Wahl is associated with the Battelle Memorial Institute, where he applies his expertise in developing innovative solutions in his field. His work has been instrumental in advancing technologies related to spectral analysis and ion detection.
Collaborations
Wahl has collaborated with notable coworkers, including Kristin H Jarman and Alan R Willse, contributing to various projects and innovations within his field.
Conclusion
Jon H Wahl's contributions to spectral analysis and ion detection demonstrate his commitment to innovation and excellence in scientific research. His patents reflect a deep understanding of complex analytical techniques and their applications in real-world scenarios.