This inventor holds 1 USPTO granted patent. Top assignee: Network Appliance, Inc.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Jon G Elerath: Innovator in Disk Drive Reliability Analysis
Introduction
Jon G Elerath is a notable inventor based in Cupertino, CA (US). He has made significant contributions to the field of reliability analysis, particularly concerning disk drive failures. His innovative approach has paved the way for improved understanding and management of disk drive reliability.
Latest Patents
Jon G Elerath holds a patent for a "Method and system for reliability analysis of disk drive failures." This invention provides a comprehensive method for performing reliability analysis of disk drive failure mechanisms. The analysis is based on information obtained from a database that contains identification details about individual drives and their families deployed in the field. An error database records error codes issued by disk drives during specific events, which are then reported to storage system administrators. The mapping of disk drive information and error codes allows for the translation of these codes into failure mechanisms for particular drive families. The analysis culminates in a hazard rate plot for all failure indicators or selected subpopulations over a specified time.
Career Highlights
Jon G Elerath is currently associated with Network Appliance, Inc., where he applies his expertise in reliability analysis. His work has been instrumental in enhancing the reliability of disk drives, contributing to the overall efficiency of storage systems.
Collaborations
Jon collaborates with Sandeep K Shah, leveraging their combined expertise to advance innovations in disk drive technology.
Conclusion
Jon G Elerath's contributions to the field of disk drive reliability analysis exemplify the impact of innovative thinking in technology. His patent and ongoing work continue to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
