Company Filing History:
Years Active: 2001-2010
Title: Innovations of Jon D Barger
Introduction
Jon D Barger is a notable inventor based in Snohomish, WA (US). He has made significant contributions to the field of microelectromechanical systems (MEMs) with a total of eight patents to his name. His work primarily focuses on developing advanced scanning devices that utilize variable resonant frequencies.
Latest Patents
Among his latest patents are the "Frequency Tunable Resonant Scanner and Method of Making" and the "Resonant Beam Scanner with Raster Pinch Compensation." The first patent describes a MEMs scanning device that features a variable resonant frequency. This device includes a torsion arm that supports an oscillatory body, with an array of removable masses that can be adjusted to establish the desired resonant frequency. Techniques such as laser ablation and etching are employed to modify the material, while a migratory material can also be stimulated to change the mechanical properties of the torsion arm. The second patent similarly outlines a MEMs scanning device with a focus on tuning the resonant frequency through the addition or removal of symmetrically distributed masses.
Career Highlights
Jon D Barger is currently associated with Microvision, Inc., where he continues to innovate in the field of MEMs technology. His work has been instrumental in advancing the capabilities of scanning devices, making them more efficient and versatile.
Collaborations
Throughout his career, Jon has collaborated with notable colleagues such as David William Wine and Clarence T Tegreene. These partnerships have contributed to the development of cutting-edge technologies in the MEMs sector.
Conclusion
Jon D Barger's contributions to the field of MEMs and scanning technology are significant and impactful. His innovative patents reflect a commitment to advancing technology and improving device functionality.