This inventor holds 1 USPTO granted patent. Top assignee: The United States of America as Represented by the Administrator of the. Active years: 1984.
Company Filing History:
Years Active: 1984
Title: John W Jackson, Jr: Innovator in X-ray Spectrometry
Introduction
John W Jackson, Jr. is a notable inventor based in Mt. Rainer, MD (US). He has made significant contributions to the field of imaging technology, particularly through his innovative work on X-ray spectrometers. His expertise and creativity have led to advancements that enhance imaging and energy resolution in X-ray applications.
Latest Patents
Jackson holds a patent for an "Imaging X-ray Spectrometer." This invention features an X-ray spectrometer designed to provide imaging and energy resolution of an X-ray source. The device comprises a thick silicon wafer with an embedded matrix of aluminum, which is fabricated through thermal migration. The aluminum matrix defines the walls of a rectangular array of silicon X-ray detector cells, or 'pixels.' Each silicon cell is equipped with a thermally diffused aluminum electrode, which is connected to biasing means. This configuration allows for lateral charge carrier depletion, enabling incident X-ray energy to cause a photo-electric reaction within the silicon, producing collectible charge carriers in the form of electrons for imaging purposes.
Career Highlights
Throughout his career, Jackson has demonstrated a commitment to innovation and excellence in his field. His work on the Imaging X-ray Spectrometer exemplifies his ability to merge theoretical knowledge with practical applications. This invention not only showcases his technical skills but also his dedication to improving imaging technologies.
Collaborations
Jackson has collaborated with notable colleagues, including Patrick A Grant and Francis E Marshall. These partnerships have likely contributed to the development and refinement of his inventions, fostering an environment of shared knowledge and expertise.
Conclusion
John W Jackson, Jr. is a distinguished inventor whose work in X-ray spectrometry has made a lasting impact on imaging technology. His innovative spirit and collaborative efforts continue to drive advancements in the field.