Iowa City, IA, United States of America

John W Haller

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John W Haller. Retrieved from https://idiyas.com/inventor/john-w-haller

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 34(Granted Patents)


Company Filing History:

goldMedal1 out of 834,659 
Other
 patents

Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: John W Haller: Innovator in Automatic Shape Characterization

Introduction

John W Haller is a notable inventor based in Iowa City, IA (US). He has made significant contributions to the field of automatic shape characterization. His innovative approach has led to the development of a unique patent that showcases his expertise and creativity.

Latest Patents

John W Haller holds a patent titled "Method and apparatus for automatic shape characterization." This patent represents his commitment to advancing technology and improving processes in his field. He has successfully secured 1 patent that highlights his inventive capabilities.

Career Highlights

Throughout his career, John has demonstrated a strong dedication to innovation. His work has not only contributed to his personal achievements but has also had a positive impact on the industry. His focus on automatic shape characterization has positioned him as a key player in this area of research.

Collaborations

John W Haller has collaborated with esteemed colleagues, including Michael I Miller and John G Csenansky. These partnerships have allowed him to enhance his work and explore new ideas in the realm of invention.

Conclusion

John W Haller is a distinguished inventor whose work in automatic shape characterization has made a lasting impact. His patent and collaborations reflect his commitment to innovation and excellence in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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