Grand Forks, ND, United States of America

John W Diehl

This inventor holds 1 USPTO granted patent. Top assignee: Und-Sem Foundation. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John W Diehl. Retrieved from https://idiyas.com/inventor/john-w-diehl-s8itggyw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: John W. Diehl: Innovator in Mass Spectrometry Technology

Introduction

John W. Diehl is a notable inventor based in Grand Forks, ND (US). He has made significant contributions to the field of mass spectrometry through his innovative designs and patents. His work focuses on enhancing the efficiency and functionality of mass spectrometers, which are essential tools in various scientific and industrial applications.

Latest Patents

One of John W. Diehl's key patents is for an "Open-split interface for mass spectrometers." This invention features a connector body with four leg members arranged in a single plane. The design includes coaxial legs and tubular apertures that facilitate the connection of gas chromatographs and mass spectrometers. The innovative structure allows for improved flow management and efficiency in mass spectrometry applications.

Career Highlights

John W. Diehl is associated with the UND-Sem Foundation, where he continues to develop and refine technologies related to mass spectrometry. His expertise in this area has led to advancements that benefit researchers and industries relying on precise analytical measurements.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

John W. Diehl's contributions to mass spectrometry through his patent demonstrate his commitment to innovation in scientific instrumentation. His work continues to influence the field and enhance analytical capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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