Company Filing History:
Years Active: 1990-1992
Title: John Taylor: Innovator in Surface Measurement Technologies
Introduction
John Taylor is a notable inventor based in New Castle, DE (US). He has made significant contributions to the field of surface measurement technologies, holding a total of 2 patents. His work focuses on advanced methods and apparatuses that enhance the precision of surface analysis.
Latest Patents
One of Taylor's latest patents is titled "Method and apparatus for measuring surface flatness." This invention relates to a method and apparatus for determining the flatness or planarity of a surface, specifically utilizing a computerized optics technique. Another significant patent is the "Scanning laser microscope system and methods of use." This system assists in the detection and characterization of fine details and structures of materials or other samples. It includes means for enhancing light from the material to detect anomalies, such as inclusions and crystal lattice dislocations.
Career Highlights
John Taylor is currently employed at E.I. du Pont de Nemours and Company, where he applies his expertise in surface measurement technologies. His innovative work has contributed to advancements in material science and engineering.
Collaborations
Some of his notable coworkers include William E. Wolf and Alfred Hirschle, who have collaborated with him on various projects within the company.
Conclusion
John Taylor's contributions to surface measurement technologies through his patents and work at E.I. du Pont de Nemours and Company highlight his role as an influential inventor in his field. His innovations continue to impact the way materials are analyzed and understood.