The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 1990
Filed:
Jul. 31, 1989
William E Wolf, Chesapeake City, MD (US);
Alfred Hirschle, Wilmington, DE (US);
Derrick P Lattibeaudiere, Newark, DE (US);
Robert H Livermore, Newark, DE (US);
Alan P Stamford, Swarthmore, PA (US);
John Taylor, New Castle, DE (US);
E. I. Du Pont de Nemours and Company, Wilmington, DE (US);
Abstract
A scanning laser microscope system for assisting in the detection and characterization of fine details and structures of materials or other samples. The system can have means for enhancing light from the material to assist detection of anomalies, such as inclusions in the material and crystal lattice dislocations. The system can have means for enhancing fluorescent light emitted from the sample. The system can further have very precise means for processing signals representative of light detected from the material.