Troy, MI, United States of America

John T McGowan

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Infineon Technologies Ag. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John T McGowan. Retrieved from https://idiyas.com/inventor/john-t-mcgowan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovations of John T McGowan

Introduction

John T McGowan is an accomplished inventor based in Troy, MI (US). He is known for his innovative contributions to tire monitoring technology. His work has led to the development of a unique system that enhances vehicle safety and efficiency.

Latest Patents

John T McGowan holds a patent for a Smart Time Tire Monitoring System. This system includes a plurality of tire sensor modules that are designed to transmit tire data wirelessly at predetermined time intervals. The vehicle control module receives this data and dictates the intervals for transmission, ensuring timely and accurate monitoring of tire conditions.

Career Highlights

John is currently employed at Infineon Technologies AG, where he continues to push the boundaries of technology in the automotive sector. His innovative approach has made significant strides in improving vehicle safety through advanced monitoring systems.

Collaborations

Some of his notable coworkers include Michael A Thomas and Robert D LeFort, who contribute to the collaborative environment that fosters innovation at Infineon Technologies AG.

Conclusion

John T McGowan's work exemplifies the spirit of innovation in the automotive industry. His contributions, particularly in tire monitoring technology, have the potential to enhance vehicle safety and performance significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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