logo

For the Inventor, By the Inventor

Chatham, IL, United States of America

John T Knepler

This inventor holds 4 USPTO granted patents. Top assignee: Dickey-John Corporation. Active years: 1978-1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John T Knepler. Retrieved from https://idiyas.com/inventor/john-t-knepler-1iyvz73l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4

% Patents Active = 100.0

Average Co-Inventor Count = 1.1

ph-index = 3

Forward Citations = 51(Granted Patents)


Company Filing History:

goldMedal4 out of 81 
 
Dickey-John Corporation
 patents

Years Active: 1978-1985

Loading Chart...
4 patents (USPTO):Explore Patents
1. 4491241 - Grain drill monitor (1985-01-01),
2. 4164669 - Seed sensor (1979-08-14),
3. 4112777 - Air pressure monitor (1978-09-12),
4. 4100538 - Seed level sensor for automatic seed planting apparatus (1978-07-11),

Title: The Inventor John T Knepler: Pioneering Innovations in Chatham, IL

Introduction: John T Knepler is a distinguished inventor based in Chatham, IL, known for his groundbreaking contributions to various fields through his innovative creations.

Latest Patents: John T Knepler holds several patents in diverse areas, showcasing his versatility and creativity in inventing new solutions to complex problems.

Career Highlights: Throughout his illustrious career, John T Knepler has consistently pushed the boundaries of innovation, earning recognition for his impactful inventions that have improved industries and people's lives.

Collaborations: John T Knepler has collaborated with leading experts in different sectors, fostering a culture of innovation and knowledge-sharing to drive progress and create cutting-edge technologies.

Conclusion: John T Knepler's legacy as an inventor in Chatham, IL, is marked by his relentless pursuit of innovation, leaving a lasting impact on the world through his remarkable inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…