Derry, NH, United States of America

John Sweeney

This inventor holds 1 USPTO granted patent. Top assignee: Digital Equipment Corporation. Active years: 1990.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: John Sweeney - Innovator in Semiconductor Testing

Introduction

John Sweeney is a notable inventor based in Derry, NH (US). He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for continuity testing in integrated semiconductor components.

Latest Patents

Sweeney holds a patent for a "Method and on-chip apparatus for continuity testing." This invention provides a method for performing continuity testing of individual lead sets bonded to an integrated semiconductor component. The continuity test circuit includes multiple current gates, each associated with different semiconductor component contact pads. This design allows for effective testing of lead sets, ensuring proper bonding and functionality.

Career Highlights

John Sweeney has worked at Digital Equipment Corporation, where he has applied his expertise in semiconductor technology. His work has been instrumental in advancing testing methods that enhance the reliability of semiconductor components. With a focus on innovation, Sweeney has contributed to the development of efficient testing solutions.

Collaborations

Throughout his career, Sweeney has collaborated with notable colleagues, including Diethelm G Ringleb and Reinhard C Schumann. These collaborations have fostered an environment of innovation and have led to advancements in semiconductor testing technologies.

Conclusion

John Sweeney's contributions to the field of semiconductor technology, particularly through his patented method for continuity testing, highlight his role as an innovator. His work continues to influence the industry and improve the reliability of integrated semiconductor components.

Profile summary based on public USPTO records.
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