Cambridge, MA, United States of America

John Sebastian Donnal

This inventor holds 2 USPTO granted patents. Top assignee: Massachusetts Institute of Technology. Active years: 2018-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Sebastian Donnal. Retrieved from https://idiyas.com/inventor/john-sebastian-donnal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2018-2022

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2 patents (USPTO):Explore Patents

Title: John Sebastian Donnal: Innovator in Non-Intrusive Monitoring

Introduction

John Sebastian Donnal is a notable inventor based in Cambridge, MA (US). He has made significant contributions to the field of non-intrusive monitoring, holding a total of 2 patents. His work focuses on innovative methods and apparatus that enhance the monitoring of physical parameters.

Latest Patents

Donnal's latest patents include groundbreaking techniques for non-intrusive monitoring by sensing electric and/or magnetic fields. These methods have potential applications in various fields, such as monitoring electricity consumption in homes and businesses. Additionally, his inventions can be utilized for industrial process monitoring, showcasing their versatility and importance in modern technology.

Career Highlights

John Sebastian Donnal is affiliated with the Massachusetts Institute of Technology, where he continues to push the boundaries of innovation. His work has garnered attention for its practical applications and contributions to energy efficiency and resource management.

Collaborations

Some of his notable coworkers include James Paris and Steven B Leeb, who have collaborated with him on various projects related to his patents.

Conclusion

John Sebastian Donnal's contributions to non-intrusive monitoring exemplify the impact of innovative thinking in technology. His patents not only advance scientific understanding but also offer practical solutions for everyday challenges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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