Cambridge, MA, United States of America

John Scott Knight

This inventor holds 1 USPTO granted patent. Top assignee: Raytheon Bbn Technologies Corp.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Scott Knight. Retrieved from https://idiyas.com/inventor/john-scott-knight

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: John Scott Knight: Innovator in Parasitic Sensing

Introduction

John Scott Knight is a notable inventor based in Cambridge, MA (US). He has made significant contributions to the field of electrical engineering, particularly in the area of parasitic sensing. His innovative approach has led to the development of methods and systems that enhance the understanding of circuit parameters.

Latest Patents

John Scott Knight holds 1 patent for his work titled "Methods and systems for parasitic sensing." This patent describes a method that involves measuring a parameter of a circuit at two different times using electrical elements native to a domain. The process includes comparing these measurements to determine if an activity has occurred within the domain.

Career Highlights

Knight is associated with Raytheon Bbn Technologies Corp., where he applies his expertise in electrical engineering. His work has been instrumental in advancing technologies that rely on accurate sensing methods.

Collaborations

Some of his notable coworkers include Ronald Bruce Coleman and George Woods Shepard. Their collaborative efforts contribute to the innovative environment at Raytheon Bbn Technologies Corp.

Conclusion

John Scott Knight's contributions to parasitic sensing exemplify the impact of innovative thinking in electrical engineering. His patent reflects a commitment to advancing technology and improving circuit analysis methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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