Houston, TX, United States of America

John Scott Harsany

This inventor holds 4 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Compaq Computer Corporation, Inc.. Active years: 1994-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Scott Harsany. Retrieved from https://idiyas.com/inventor/john-scott-harsany

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 4

Forward Citations = 299(Granted Patents)


Company Filing History:


Years Active: 1994-1999

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4 patents (USPTO):Explore Patents

Title: John Scott Harsany: Diagnostic Software Inventor

Introduction

John Scott Harsany is an inventor associated with Houston, Texas. His work includes diagnostic software tools designed to organize and run independent test modules. He holds 4 patents.

Latest Patents

Harsany’s listed patents include “Test Definition Tool” and “Diagnostic Module Dispatcher.” Both describe a modular diagnostic application in which independent test modules can run concurrently. The dispatcher uses test parameters, including whether a module supports multitasking, to manage the launch of tests.

The inventions also describe a graphical tool for creating diagnostic scripts by moving icons between lists. The tool produces scripts in a language that the diagnostic application can read.

Career Highlights

Harsany’s professional affiliations include Compaq Computer Corporation and Hewlett Packard Enterprise Development LP. His patent work reflects an emphasis on diagnostic applications, test automation, and modular software design.

Collaborations

His listed coworkers include Robert Perugini and Robert E. Supak.

Conclusion

John Scott Harsany’s patents document contributions to diagnostic software, particularly tools for defining tests and coordinating multitasking test modules.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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