Berkeley, CA, United States of America

John Santerre

This inventor holds 1 USPTO granted patent. Top assignee: United States of America as Represented by the Administrator of NASA. Active years: 2026.


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of John Santerre

Introduction

John Santerre is an accomplished inventor based in Berkeley, CA. He has made significant contributions to the field of image analysis through his innovative patent. His work focuses on the analysis of spherical areas from two-dimensional images, showcasing his expertise in engineering and technology.

Latest Patents

John Santerre holds a patent titled "Apparatus and method of grid-oriented normalization for analysis of spherical areas from 2-D image." This invention includes a sophisticated system that determines feature metrics on a spherical surface. The system is designed to operate at a client/server level and comprises several key components. These include a grid generation engine, a feature segmentation engine, a grid overlay and enumeration engine, and a feature parameterization engine. Together, these components enable the analysis of various metrics, such as total area, centroid, moments of inertia, and more.

Career Highlights

Santerre is currently employed by the United States of America as represented by the Administrator of NASA. His role involves applying his innovative ideas to real-world challenges, particularly in the realm of image processing and analysis. His work has the potential to impact various fields, including aerospace and medical imaging.

Collaborations

Some of his notable coworkers include Conor A Nixon and Zachary Yahn. Their collaboration contributes to the advancement of technology and innovation within their projects.

Conclusion

John Santerre's contributions to the field of image analysis through his patent demonstrate his innovative spirit and technical expertise. His work continues to influence advancements in technology and engineering.

Profile summary based on public USPTO records.
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