John Roy Sambles

Title: Innovations of John Roy Sambles in Surface Plasmon Ellipsometry

Introduction

John Roy Sambles is a notable inventor based in Devon, GB. He has made significant contributions to the field of surface plasmon ellipsometry, particularly through his innovative methods that enhance the sensitivity of analytical apparatus. His work is crucial for advancing technologies that rely on precise surface analysis.

Latest Patents

Sambles holds a patent for a method of optimizing the sensitivity of a surface plasmon ellipsometry apparatus. This patent outlines a technique that involves calculating a sensitivity map for plasmon ellipsometry, which defines variations in sensitivity based on the angle of incidence and polarization angle of polarized light. This method allows for the configuration of the apparatus to operate in a region of maximum sensitivity, thereby improving the accuracy of surface analysis.

Career Highlights

Throughout his career, John Roy Sambles has been associated with Attomarker Limited, where he has applied his expertise in surface plasmon technology. His work has been instrumental in developing advanced analytical tools that are widely used in scientific research and industrial applications.

Collaborations

Sambles has collaborated with notable colleagues, including Ian Richard Hooper and Ciaran Eoin Stewart. These collaborations have further enriched his research and contributed to the development of innovative solutions in the field.

Conclusion

John Roy Sambles is a distinguished inventor whose work in surface plasmon ellipsometry has led to significant advancements in sensitivity optimization. His contributions continue to impact the field positively, showcasing the importance of innovation in scientific research.